Résumé:
This work consists to the development and the characterization of thin films of ZnO and of the bilayer ZnO/TiO2,ZnO/SnO2. The films are deposited by the sol-gel dip-coating and spay methods, onto glass substrate. The heat treatment is carried in air and under oxygen atmospher..
The obtained samples ara analysed by means of the x-rays diffraction (DRX), atomic force spectroscopy (AFM), spectroscopic ellipsometry (SE), UV-Visible and of the optical prism coupler spectroscopies.
The XRD results show that the film of the ZnO films crystallize in the wurtzit phase (hexagonal). The XRD shows that the film TiO2 and SnO2 have an effect on the thin film of ZnO. The AFM surface observation indicate that the nature of the annealing atmosphere affect considerably the roughness of the ZnO/TiO2, ZnO/SnO2 systemes. The optical analysis show that the ZnO films are transparantent (80-65%) in the visible and opaque in UV region.
The refractive index, porosity and optical gap depend on vary the thickness of films, the thermal annealing and the annealing tmosphere
