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Characterization of PbS nanoparticles trapped in Y zeolite by X ray diffraction and scanning electron microscopy

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dc.contributor.author Tebani, H.
dc.contributor.author Keghouche, N.
dc.date.accessioned 2022-12-25T21:35:30Z
dc.date.available 2022-12-25T21:35:30Z
dc.date.issued 2016-12-14
dc.identifier.uri http://depot.umc.edu.dz/handle/123456789/13863
dc.description.abstract The present study examines the PbS semiconductor nanoparticles trapped in Y zeolite synthesized at room temperature via a simple chemical reaction when 2-mercaptoethanol noted RSH was used with a different amounts as a sulfur source. The obtained samples were calcined at various temperatures (T = 100 - 550°C). X ray diffraction (XRD) and scanning electron microscopy (SEM) were used to characterize the samples at different steps of their elaboration. After thiol addition, the X-rays diffraction reveals the formation of galena lead sulfide phase. The PbS crystallite size, is about 20 nm. After calcinations XRD patterns present the features of PbS. These results are in good agreement with SEM observations which show rod-shapped crystallites corresponding to the first series of samples (ɸ = 20-50 nm, l = 5-10 μm). In the second series the crystallites form clusters at 550°C with an average size of 20-50 nm. fr_FR
dc.language.iso en fr_FR
dc.publisher Université Frères Mentouri - Constantine 1 fr_FR
dc.subject Y zeolite fr_FR
dc.subject semi-conductor fr_FR
dc.subject nanorods fr_FR
dc.subject PbS fr_FR
dc.subject thiol fr_FR
dc.subject clusters fr_FR
dc.title Characterization of PbS nanoparticles trapped in Y zeolite by X ray diffraction and scanning electron microscopy fr_FR
dc.type Article fr_FR


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