| dc.contributor.author | Benkherourou Ouahab | |
| dc.contributor.author | Deville J.P. | |
| dc.date.accessioned | 2022-05-30T09:37:36Z | |
| dc.date.available | 2022-05-30T09:37:36Z | |
| dc.date.issued | 2017-01-01 | |
| dc.identifier.uri | http://depot.umc.edu.dz/handle/123456789/11902 | |
| dc.language.iso | fre | |
| dc.subject | Physique | |
| dc.title | Caracterisation des interfaces Si/O2 , Si/Si3N4 et Si/SiOxNy par spectroscopie des photoelectrons (XPS) | |
| dc.coverage | 02 Disponibles au magazin de la bibliothèque centrale |
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